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利用自旋复用超表面测量光的相位和偏振奇点。

Measuring phase and polarization singularities of light using spin-multiplexing metasurfaces.

机构信息

Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen University, Shenzhen 518060, China.

出版信息

Nanoscale. 2019 Oct 10;11(39):18303-18310. doi: 10.1039/c9nr05811g.

DOI:10.1039/c9nr05811g
PMID:31573007
Abstract

In recent years, light beams containing phase or polarization singularities, such as optical vortices (OVs) and cylindrical vector beams (CVBs), have contributed to significant applications including optical orbital angular momentum (OAM) communications, particle trapping and manipulation, and super-resolved imaging. However, traditional methods for detecting the phase and polarization singularities of light suffer from drawbacks, such as large device size, complicated optics, and limits in detection function. Here, we propose an alternative method for detecting simultaneously phase and polarization singularities based on a spin-multiplexing metasurface. Both numerical and experimental results demonstrate that the metasurface device can be used to measure accurately the topological charge of OVs and the polarization order of CVBs individually or simultaneously, and exhibit beneficial attributes such as a broadband response, compactness, and system simplification. This method offers great potential in applications such as singular optical beam shaping and high-capacity OAM/CVB multiplexing communication.

摘要

近年来,包含相位或偏振奇点的光束,如光学涡旋(OVs)和圆柱矢量光束(CVBs),在光轨道角动量(OAM)通信、粒子俘获和操控以及超分辨成像等领域得到了广泛应用。然而,传统的光相位和偏振奇点检测方法存在设备尺寸大、光学结构复杂以及检测功能受限等缺点。在这里,我们提出了一种基于自旋复用超表面的同时检测相位和偏振奇点的替代方法。数值和实验结果均表明,该超表面器件可用于准确测量 OVs 的拓扑电荷和 CVBs 的偏振阶数,并且具有宽带响应、紧凑性和系统简化等有益特性。这种方法在奇异光光束整形和大容量 OAM/CVB 复用通信等应用中具有很大的应用潜力。

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