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利用XANES/EXAFS光谱研究污染稻田土壤和水稻中有毒镉的形态及归宿

Speciation and fate of toxic cadmium in contaminated paddy soils and rice using XANES/EXAFS spectroscopy.

作者信息

Kunene Sikhumbuzo Charles, Lin Kuen-Song, Mdlovu Ndumiso Vukile, Lin You-Sheng, Mdlovu Ncobile Bagezile

机构信息

Department of Chemical Engineering and Materials Science/Environmental Technology Research Centre, Yuan Ze University, Chung-Li District, Taoyuan City, 32003, Taiwan.

Department of Chemical Engineering and Materials Science/Environmental Technology Research Centre, Yuan Ze University, Chung-Li District, Taoyuan City, 32003, Taiwan.

出版信息

J Hazard Mater. 2020 Feb 5;383:121167. doi: 10.1016/j.jhazmat.2019.121167. Epub 2019 Sep 5.

Abstract

The present study was conducted to determine the Cd distribution and speciation in contaminated paddy soils and rice kernels using XANES/EXAFS spectroscopy. The morphology and crystallization of rice and soils were investigated using FE-SEM and XRD techniques. The EXAFS spectra of Cd in soil and rice kernels showed that cadmium oxides (CdO) in soil and rice kernels formed Cd clusters with Cd-O bond distances of 2.35 Å and 2.83 Å (coordination numbers of 2.3 and 4.2), respectively. The XRD patterns show that silica oxide (SiO, 2θ  = 24.2) and aluminum oxide (AlO, 2θ = 35.7) were the main components detected. The FE-SEM analysis revealed that the surface characteristics and sizes of the rice kernels are smooth and uneven with particle sizes of 0.5-4 μm, while the soil particles are not uniform and aggregated. Furthermore, the distribution of toxic metals/metalloid (Cd, Pb, Cr, Ni, As, Cu, and Zn) accumulated in the contaminated paddy soils and rice crops were also examined. Interestingly, these results offered an insight into the accumulation mechanism and distribution of heavy metals in contaminated rice farming soils and rice crops.

摘要

本研究旨在利用X射线吸收近边结构/扩展X射线吸收精细结构光谱法(XANES/EXAFS)测定受污染稻田土壤和水稻籽粒中镉的分布及形态。采用场发射扫描电子显微镜(FE-SEM)和X射线衍射(XRD)技术研究了水稻和土壤的形态及结晶情况。土壤和水稻籽粒中镉的EXAFS光谱表明,土壤和水稻籽粒中的氧化镉(CdO)形成了镉簇,其Cd-O键距分别为2.35 Å和2.83 Å(配位数分别为2.3和4.2)。XRD图谱显示,检测到的主要成分是氧化硅(SiO,2θ = 24.2)和氧化铝(AlO,2θ = 35.7)。FE-SEM分析表明,水稻籽粒的表面特征和尺寸光滑且不均匀,粒径为0.5 - 4μm,而土壤颗粒不均匀且聚集。此外,还检测了受污染稻田土壤和水稻作物中积累的有毒金属/类金属(镉、铅、铬、镍、砷、铜和锌)的分布。有趣的是,这些结果为受污染水稻种植土壤和水稻作物中重金属的积累机制和分布提供了深入了解。

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