Finkel Matvey, Thierschmann Holger, Katan Allard J, Westig Marc P, Spirito Marco, Klapwijk Teun M
Kavli Institute of NanoScience, Department of Quantum Nanoscience, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
Department of Microelectronics, Faculty of Electrical Engineering, Delft University of Technology, Mekelweg 4, 2629 JA Delft, The Netherlands.
Rev Sci Instrum. 2019 Nov 1;90(11):113701. doi: 10.1063/1.5116801.
We have realized a microstrip based terahertz (THz) near field cantilever that enables quantitative measurements of the impedance of the probe tip at THz frequencies (0.3 THz). A key feature is the on-chip balanced hybrid coupler that serves as an interferometer for passive signal cancellation to increase the readout circuit sensitivity despite extreme impedance mismatch at the tip. We observe distinct changes in the reflection coefficient of the tip when brought into contact with different dielectric (Si, SrTiO) and metallic samples (Au). By comparing finite element simulations, we determine the sensitivity of our THz probe to be well below 0.25 fF. The cantilever further allows for topography imaging in a conventional atomic force microscope mode. Our THz cantilever removes several critical technology challenges and thus enables a shielded cantilever based THz near field microscope.
