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Development of 1.2-GHz ECR ion source and Wien filter for inexpensive ion beam processing system.

作者信息

Asaji Toyohisa, Uyama Hiroya, Umetsugu Takuro, Nakamura Tsubasa, Hitobo Takeshi, Kato Yushi

机构信息

National Institute of Technology, Toyama College, 13 Hongo-machi, Toyama City, Toyama 939-8630, Japan.

National Institute of Technology, Oshima College, 1091-1 Komatsu, Suouoshima, Yamaguchi 742-2193, Japan.

出版信息

Rev Sci Instrum. 2019 Dec 1;90(12):123508. doi: 10.1063/1.5127348.

Abstract

A desktop-sized ion beam processing system with an inexpensive electron cyclotron resonance (ECR) ion source has been developed for industrial applications at the National Institute of Technology, Toyama College. A commercially available 1.2- to 1.3-GHz transceiver is adopted as a microwave source to generate the ECR plasma. The minimum-B magnetic field is formed by arranging small rectangular permanent magnets. A Wien filter with orthogonal electric and magnetic fields is employed as a beam separator. At the end of the beam line, a processing chamber with a substrate stage for ion beam applications, such as ion implantation and microfabrication, is installed. Here, we report the results of the first experiment. Ar ion beams with a current of approximately 62 µA were obtained at an extraction voltage of 4 kV. In addition, we demonstrate that Ar and Xe ions can be separated by the Wien filter.

摘要

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