Asaji Toyohisa, Uyama Hiroya, Umetsugu Takuro, Nakamura Tsubasa, Hitobo Takeshi, Kato Yushi
National Institute of Technology, Toyama College, 13 Hongo-machi, Toyama City, Toyama 939-8630, Japan.
National Institute of Technology, Oshima College, 1091-1 Komatsu, Suouoshima, Yamaguchi 742-2193, Japan.
Rev Sci Instrum. 2019 Dec 1;90(12):123508. doi: 10.1063/1.5127348.
A desktop-sized ion beam processing system with an inexpensive electron cyclotron resonance (ECR) ion source has been developed for industrial applications at the National Institute of Technology, Toyama College. A commercially available 1.2- to 1.3-GHz transceiver is adopted as a microwave source to generate the ECR plasma. The minimum-B magnetic field is formed by arranging small rectangular permanent magnets. A Wien filter with orthogonal electric and magnetic fields is employed as a beam separator. At the end of the beam line, a processing chamber with a substrate stage for ion beam applications, such as ion implantation and microfabrication, is installed. Here, we report the results of the first experiment. Ar ion beams with a current of approximately 62 µA were obtained at an extraction voltage of 4 kV. In addition, we demonstrate that Ar and Xe ions can be separated by the Wien filter.