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由于气泡与固体表面之间的中间水膜中形成瞬态空洞而导致附着的随机诱导时间。

Stochastic induction time of attachment due to the formation of transient holes in the intervening water films between air bubbles and solid surfaces.

作者信息

Li Saiwei, Nguyen Anh V, Sun Zhiqiang

机构信息

School of Energy Science and Engineering, Central South University, Changsha 410083, China; School of Chemical Engineering, The University of Queensland, Brisbane 4072, Australia.

School of Chemical Engineering, The University of Queensland, Brisbane 4072, Australia.

出版信息

J Colloid Interface Sci. 2020 Apr 1;565:345-350. doi: 10.1016/j.jcis.2020.01.027. Epub 2020 Jan 16.

Abstract

HYPOTHESIS

Bubble attachment to hydrophobic solid surfaces is influenced by the liquid film instability. Inclusion of transiently formed holes within the film rather than the so-called hydrophobic force in the theory is expected to better describe and explain film rupture and triple contact line formation in the bubble-surface attachment process. The significance of surface hydrophobicity and hole formation renders the stochastic nature of the induction time of attachment.

EXPERIMENTS

A combination of high-speed video microscopy and theoretical analysis was applied to investigate the induction time of attachment and critical film thickness of air bubbles rising freely perpendicularly to silica surfaces of different hydrophobicities.

FINDINGS

Film rupture occurred statistically for shorter induction times and thicker films on the more hydrophobic surface, rejecting the conjecture of hydrophobic force. Computed results of the critical base radius of the transient holes causing film rupture were merged together nicely, independently of surface hydrophobicity. The paper sheds light on the significance of hydrophobicity on the attachment process by means of a novel and easily implemented methodology, without relying on the debatable hydrophobic force.

摘要

假设

气泡附着于疏水固体表面受液膜不稳定性影响。理论中纳入液膜内瞬时形成的孔洞而非所谓的疏水力,有望更好地描述和解释气泡 - 表面附着过程中的膜破裂和三相接触线形成。表面疏水性和孔洞形成的重要性致使附着诱导时间具有随机性。

实验

运用高速视频显微镜和理论分析相结合的方法,研究垂直于不同疏水性二氧化硅表面自由上升的气泡的附着诱导时间和临界膜厚度。

研究结果

在疏水性更强的表面上,统计显示膜破裂发生在更短的诱导时间和更厚的膜时,这否定了疏水力的推测。导致膜破裂的瞬时孔洞临界底部半径的计算结果很好地合并在一起,与表面疏水性无关。本文通过一种新颖且易于实施的方法,揭示了疏水性在附着过程中的重要性,而无需依赖有争议的疏水力。

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