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平面波成象技术在具有非平面表面的组件浸液检测中的应用。

Plane Wave Imaging Techniques for Immersion Testing of Components With Nonplanar Surfaces.

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 2020 Jul;67(7):1303-1316. doi: 10.1109/TUFFC.2020.2969083. Epub 2020 Jan 23.

Abstract

Plane wave imaging (PWI) is an ultrasonic array imaging technique used in nondestructive testing, which has been shown to yield high resolution with few transmissions. Only a few published examples are available of PWI of components with nonplanar surfaces in immersion. In these cases, inspections were performed by adapting the transmission delays in order to produce a plane wave inside the component. This adaptation requires prior knowledge of the component geometry and position relative to the array. This article proposes a new implementation, termed PWI adapted in postprocessing (PWAPP), which has no such requirement. In PWAPP, the array emits a plane wave as in conventional PWI. The captured data are input into two postprocessing stages. The first reconstructs the surface of the component; the latter images inside of it by adapting the delays to the distortion of the plane waves upon refraction at the reconstructed surface. Simulation and experimental data are produced from an immersed sample with a concave front surface and artificial defects. These are processed with conventional and surface corrected PWI. Both algorithms involving surface adaptation produced nearly equivalent results from the simulated data, and both outperform the nonadapted one. Experimentally, all defects are imaged with a signal-to-noise ratio (SNR) of at least 31.8 and 33.5 dB for, respectively, PWAPP and PWI adapted in transmission but only 20.5 dB for conventional PWI. In the cases considered, reducing the number of transmissions below the number of array elements shows that PWAPP maintains its high SNR performance down to the number of firings equivalent to a quarter of the array elements. Finally, experimental data from a more complex surface specimen are processed with PWAPP resulting in detection of all scatterers and producing SNR comparable to that of the total focusing method.

摘要

平面波成像(PWI)是一种用于无损检测的超声阵列成像技术,已被证明具有高分辨率和少量发射的特点。在浸入式中对具有非平面表面的组件进行 PWI 的发表示例很少。在这些情况下,通过自适应传输延迟来进行检查,以便在组件内部产生平面波。这种自适应需要事先了解组件的几何形状和相对于阵列的位置。本文提出了一种新的实现方法,称为 PWAPP(后处理自适应平面波成像),它没有这样的要求。在 PWAPP 中,阵列像常规 PWI 一样发射平面波。捕获的数据输入到两个后处理阶段。第一阶段重建组件的表面;后者通过自适应延迟来适应平面波在重建表面上折射的失真来对其内部成像。模拟和实验数据来自具有凹前表面和人工缺陷的浸入式样品。这些数据由常规 PWI 和表面校正 PWI 进行处理。涉及表面自适应的两种算法均从模拟数据产生了几乎相同的结果,并且都优于未自适应的算法。在实验中,所有缺陷都使用信号噪声比(SNR)进行成像,PWAPP 和传输自适应 PWI 分别为至少 31.8 和 33.5 dB,但常规 PWI 仅为 20.5 dB。在所考虑的情况下,将发射次数减少到阵列元素数量以下表明 PWAPP 可以保持其高 SNR 性能,直到与发射次数相当的四分之一的阵列元素数量。最后,用 PWAPP 处理更复杂表面样本的实验数据,从而可以检测到所有散射体,并产生与全聚焦方法相当的 SNR。

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