Specimen chambers for critical point drying for scanning electron microscopy.
作者信息
Hess W M, Allen J V, Gardner J S, Reynolds J
机构信息
Department of Botany and Range Science, Brigham Young University, Provo, Utah 84602.
出版信息
J Electron Microsc Tech. 1988 Apr;8(4):443-4. doi: 10.1002/jemt.1060080413.
PMID:3199225
Abstract
摘要
Zotero 插件