Nataf G F, Guennou M
Department of Materials Science, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.
J Phys Condens Matter. 2020 May 1;32(18):183001. doi: 10.1088/1361-648X/ab68f3.
Recent studies carried out with atomic force microscopy or high-resolution transmission electron microscopy reveal that ferroic domain walls can exhibit different physical properties than the bulk of the domains, such as enhanced conductivity in insulators, or polar properties in non-polar materials. In this review we show that optical techniques, in spite of the diffraction limit, also provide key insights into the structure and physical properties of ferroelectric and ferroelastic domain walls. We give an overview of the uses, specificities and limits of these techniques, and emphasize the properties of the domain walls that they can probe. We then highlight some open questions of the physics of domain walls that could benefit from their use.
最近利用原子力显微镜或高分辨率透射电子显微镜进行的研究表明，铁电畴壁可展现出与畴体不同的物理性质，比如绝缘体中的导电性增强，或者非极性材料中的极性性质。在本综述中，我们表明，尽管存在衍射极限，但光学技术也能为铁电和铁弹畴壁的结构及物理性质提供关键见解。我们概述了这些技术的用途、特性及局限性，并强调了它们能够探测的畴壁性质。然后，我们突出了一些畴壁物理学中可借助这些技术加以研究的开放性问题。
