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二硫化钨量子点增强铟镓砷/铝镓砷量子阱的光致发光

Enhanced photoluminescence of InGaAs/AlGaAs quantum well with tungsten disulfide quantum dots.

作者信息

Su Wilson Yeung-Sy, Santiago Svette Reina Merden S, Chiang Hsieh Chia-Cheng, Wu Chii-Bin, Wang Jyh-Shyang, Chiu Kuan-Cheng, Shen Ji-Lin, Huang Chih-Yang, Chen Cheng-Ying

机构信息

Department of Physics and Center for Nanotechnology, Chung Yuan Christian University, Chung-Li, Taiwan.

出版信息

Nanotechnology. 2020 May 29;31(22):225703. doi: 10.1088/1361-6528/ab758a. Epub 2020 Feb 12.

Abstract

The pristine and diethylenetriamine (DETA)-doped tungsten disulfide quantum dots (WS QDs) with an average lateral size of about 5 nm have been synthesized using pulsed laser ablation (PLA). Introduction of the synthesized WS QDs on the InGaAs/AlGaAs quantum wells (QWs) can improve the photoluminescence (PL) of the InGaAs/AlGaAs QW as high as 6 fold. On the basis of the time-resolved PL and Kelvin probe measurements, the PL enhancement is attributed to the carrier transfer from the pristine or DETA-doped WS QDs to the InGaAs/AlGaAs QW. A heterostructure band diagram is proposed for explaining the carrier transfer, which increases the hole densities in the QW and enhances its PL intensity. This study is expected to be beneficial for the development of the InGaAs-based optoelectronic devices.

摘要

利用脉冲激光烧蚀(PLA)合成了平均横向尺寸约为5nm的原始二乙烯三胺(DETA)掺杂二硫化钨量子点(WS QDs)。将合成的WS QDs引入InGaAs/AlGaAs量子阱(QWs)中可使InGaAs/AlGaAs QW的光致发光(PL)提高高达6倍。基于时间分辨PL和开尔文探针测量,PL增强归因于载流子从原始或DETA掺杂的WS QDs转移到InGaAs/AlGaAs QW。提出了一个异质结构能带图来解释载流子转移,这增加了量子阱中的空穴密度并增强了其PL强度。这项研究有望对基于InGaAs的光电器件的发展有益。

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