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利用X射线和中子对薄膜中掩埋层和界面进行纳米尺度分析的最新进展

Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons.

作者信息

Stoev Krassimir, Sakurai Kenji

机构信息

Canadian Nuclear Laboratories, 286 Plant Road, Chalk River, Ontario, K0J1J0, Canada.

National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan.

出版信息

Anal Sci. 2020 Aug 10;36(8):901-922. doi: 10.2116/analsci.19R010. Epub 2020 Mar 6.

DOI:10.2116/analsci.19R010
PMID:32147630
Abstract

In the early 1960s, scientists achieved the breakthroughs in the fields of solid surfaces and artificial layered structures. The advancement of surface science has been supported by the advent of ultra-high vacuum technologies, newly discovered and established scanning probe microscopy with atomic resolution, as well as some other advanced surface-sensitive spectroscopy and microscopy. On the other hand, it has been well recognized that a number of functions are related to the structures of the interfaces, which are the thin planes connecting different materials, most likely by layering thin films. Despite the scientific significance, so far, research on such buried layers and interfaces has been limited, because the probing depth of almost all existing sophisticated analytical methods is limited to the top surface. The present article describes the recent progress in the nanometer scale analysis of buried layers and interfaces, particularly by using X-rays and neutrons. The methods are essentially promising to non-destructively probe such buried structures in thin films. The latest scientific research has been reviewed, and includes applications to bio-chemical, organic, electronic, magnetic, spintronic, self-organizing and complicated systems as well as buried liquid-liquid and solid-liquid interfaces. Some emerging analytical techniques and instruments, which provide new attractive features such as imaging and real time analysis, are also discussed.

摘要

20世纪60年代初,科学家们在固体表面和人工层状结构领域取得了突破。超高真空技术的出现、新发现并确立的具有原子分辨率的扫描探针显微镜以及其他一些先进的表面敏感光谱学和显微镜技术,推动了表面科学的发展。另一方面,人们已经充分认识到,许多功能与界面结构有关,界面是连接不同材料的薄层,很可能是通过薄膜分层实现的。尽管具有科学意义,但迄今为止,对这种埋藏层和界面的研究一直很有限,因为几乎所有现有精密分析方法的探测深度都仅限于表面。本文介绍了埋藏层和界面纳米尺度分析的最新进展,特别是利用X射线和中子的分析进展。这些方法对于无损探测薄膜中的此类埋藏结构具有重要前景。本文对最新的科学研究进行了综述,包括在生物化学、有机、电子、磁性、自旋电子学、自组织和复杂系统以及埋藏的液-液和固-液界面中的应用。还讨论了一些新兴的分析技术和仪器,它们具有成像和实时分析等新的吸引人的特点。

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本文引用的文献

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Thickness Changes in Temperature-Responsive Poly(-isopropylacrylamide) Ultrathin Films under Ambient Conditions.环境条件下温度响应性聚(N-异丙基丙烯酰胺)超薄膜的厚度变化
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X-ray and Neutron Reflectometry of Thin Films at Liquid Interfaces.液体界面处薄膜的X射线和中子反射测量
Langmuir. 2019 Jul 2;35(26):8519-8530. doi: 10.1021/acs.langmuir.8b04315. Epub 2019 Mar 22.
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Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal.
有机半导体单晶体的定量共振软 X 射线反射率。
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Neutron visualization of inhomogeneous buried interfaces in thin films.薄膜中非均匀掩埋界面的中子可视化
Sci Rep. 2019 Jan 24;9(1):571. doi: 10.1038/s41598-018-37094-5.
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Uniaxial Negative Thermal Expansion of Polyvinyl Acetate Thin Film.聚醋酸乙烯酯薄膜的单轴负热膨胀。
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