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利用背散射技术对某些合金的有效原子序数和反照率因子进行实验测量。

Experimental measurement of effective atomic numbers and albedo factors for some alloys using the backscattering technique.

作者信息

Kaur Taranjot, Sharma Jeewan, Singh Tejbir

机构信息

Physics Department, Sri Guru Granth Sahib World University, Fatehgarh Sahib, Punjab, 140407, India.

Nanotechnology Department, Sri Guru Granth Sahib World University, Fatehgarh Sahib, Punjab, 140407, India.

出版信息

Appl Radiat Isot. 2020 Apr;158:109065. doi: 10.1016/j.apradiso.2020.109065. Epub 2020 Feb 1.

Abstract

Alloys of the type PbSnZnCd where x = 0, 5, 10, 15 or 20 were prepared by a conventional melt quench technique. The intensity distribution of backscattered photons from the radioactive isotopes Na and Cs (with photon energies of 511 keV and 662 keV, respectively) were recorded for different thicknesses of alloy samples and some metallic samples (Al, Zn, Sn and Pb) with use of a GAMMA-RAD5 spectrometer (76 mm × 76 mm NaI(Tl) scintillation detector). Backscattered photon intensities were plotted as a function of both the atomic number and the target thickness. A best fit curve was drawn between backscattered photon counts and the atomic number of the metallic samples, from which the effective atomic numbers (Z) of the alloys were obtained at a particular photon energy as well as thickness. The experimentally obtained Z values are in good agreement with the theoretical ones (based on mass attenuation coefficients from the WinXCom database). The plot of intensity versus thickness shows that the intensity of backscattered photons increases with sample thickness. The albedo factors (energy albedo, number albedo and dose albedo) were also determined experimentally at these photon energies for the alloys and metallic samples. In the Compton scattering dominant region, the albedo factors decrease with an increase in atomic number as well as with an increase in photon energy.

摘要

通过传统的熔体淬火技术制备了x = 0、5、10、15或20的PbSnZnCd型合金。使用GAMMA - RAD5光谱仪(76 mm×76 mm NaI(Tl)闪烁探测器),针对不同厚度的合金样品以及一些金属样品(Al、Zn、Sn和Pb),记录了放射性同位素Na和Cs(光子能量分别为511 keV和662 keV)的背散射光子强度分布。将背散射光子强度绘制为原子序数和靶厚度的函数。在背散射光子计数与金属样品的原子序数之间绘制了最佳拟合曲线,由此在特定光子能量和厚度下获得了合金的有效原子序数(Z)。实验获得的Z值与理论值(基于WinXCom数据库的质量衰减系数)吻合良好。强度与厚度的关系图表明,背散射光子的强度随样品厚度增加而增加。还在这些光子能量下通过实验确定了合金和金属样品的反照率因子(能量反照率、数量反照率和剂量反照率)。在康普顿散射占主导的区域,反照率因子随着原子序数的增加以及光子能量的增加而降低。

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