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基于椭圆偏振测量法对通过施加不同极化条件获得的玻璃折射率深度分布的研究。

Ellipsometry-based study of glass refractive index depth profiles obtained by applying different poling conditions.

作者信息

Fabijanić I, Pervan P, Okorn B, Sancho-Parramon J, Janicki V

出版信息

Appl Opt. 2020 Feb 10;59(5):A69-A74. doi: 10.1364/AO.59.000A69.

DOI:10.1364/AO.59.000A69
PMID:32225356
Abstract

Application of electric field and moderately elevated temperature depletes the side facing anode from alkali present in glasses. The change of composition of the treated glass results in variation of refractive index depth profile within the treated glass. Spectroscopic ellipsometry is employed for characterization of optical properties of glass treated in different conditions. The results of optical characterization are verified by secondary ion mass spectroscopy. It is found that the refractive index profile obtained from ellipsometry has a maximum value higher than the one of untreated glass. The obtained refractive index profiles are in very good agreement with concentration profiles.

摘要

施加电场和适度升高温度会使玻璃中面向阳极一侧的碱耗尽。处理后玻璃成分的变化导致处理后玻璃内部折射率深度分布的变化。采用光谱椭偏仪对在不同条件下处理的玻璃的光学性质进行表征。光学表征结果通过二次离子质谱法进行验证。发现从椭偏仪获得的折射率分布的最大值高于未处理玻璃的最大值。所获得的折射率分布与浓度分布非常吻合。

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