Wang Zhihui, Ke Changjian, Zhong Yibo, Xing Chen, Wang Haoyu, Yang Keyuan, Cui Sheng, Liu Deming
Opt Express. 2020 Mar 16;28(6):8484-8493. doi: 10.1364/OE.387398.
Laser linewidths of the order of 100 Hz are challenging to measure with existing technology. We propose a simple, efficient method to measure ultra-narrow linewidths using dual-parameter acquisition based on partially coherent light interference. The linewidth is obtained using two parameters that are easily extracted from the power spectrum. This method reduces the influence of 1/f noise by utilizing a kilometer-order-length delay fiber and is independent of the fiber-length error for a general situation. Simulation results show that, for a length error less than 10%, the total linewidth measurement error is less than 0.3%. Experimental results confirm the feasibility and superior performance of this method.
利用现有技术测量100Hz左右的激光线宽具有挑战性。我们提出了一种基于部分相干光干涉的双参数采集测量超窄线宽的简单、高效方法。通过从功率谱中轻松提取的两个参数来获得线宽。该方法利用千米级长度的延迟光纤降低了1/f噪声的影响，并且在一般情况下与光纤长度误差无关。仿真结果表明，对于长度误差小于10%的情况，总线宽测量误差小于0.3%。实验结果证实了该方法的可行性和优越性能。
