Spycher R, Stadelmann P, Buffat P, Flueli M
Institut Interdepartémental de Microscopie Electronique, EPFL, Swiss Institute of Technology, Lausanne.
J Electron Microsc Tech. 1988 Dec;10(4):369-72. doi: 10.1002/jemt.1060100403.
High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of applications, images have been obtained from an interface in PbTiO3 and of a small gold aggregate. HREM image simulation of perfect or faulted crystals can now be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
利用多层法进行的高分辨率电子显微镜（HREM）图像模拟已在Cray 1S/2300计算机上实现，可进行精确的全非线性图像强度计算，传输函数的采样可能高达2n×2m个样本（n + m = 20）。作为应用示例，已获得钛酸铅界面和小金聚集体的图像。现在，对于涉及大量原子以及厚或大超晶胞的问题，可以在合理的计算时间内应用完美或有缺陷晶体的HREM图像模拟。
