锗的折射率。
Index of refraction of germanium.
作者信息
Burnett John H, Benck Eric C, Kaplan Simon G, Stover Erik, Phenis Adam
出版信息
Appl Opt. 2020 May 1;59(13):3985-3991. doi: 10.1364/AO.382408.
Measurements of the index of refraction of a sample of high-quality, single-crystal germanium using the minimum deviation refractometry method are presented for temperatures near 22°C and for wavelengths in the range 2 to 14 µm. The standard uncertainty for the measurements ranges from ${1.5} \times {{10}^{ - 5}}$1.5×10 to ${4.2} \times {{10}^{ - 5}}$4.2×10, generally increasing with wavelength. A Sellmeier formula fitting the data for this range is provided. Details of the custom system and procedures are presented, along with a detailed analysis of the uncertainty. These results are compared with previous measurements.
本文给出了采用最小偏向折射测量法对高质量单晶锗样品在温度接近22°C以及波长范围为2至14 µm时的折射率测量结果。测量的标准不确定度范围为1.5×10⁻⁵至4.2×10⁻⁵，通常随波长增加。给出了适用于该范围数据的Sellmeier公式。介绍了定制系统和程序的详细信息，以及不确定度的详细分析。将这些结果与先前的测量结果进行了比较。
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