Webster J G, Hua P
Department of Electrical and Computer Engineering, University of Wisconsin-Madison 53706.
Clin Phys Physiol Meas. 1988;9 Suppl A:127-30. doi: 10.1088/0143-0815/9/4a/021.
Recent progress in electrical impedance tomography in North America is reviewed. It emphasises recent progress on the hardware system, measurement method, and reconstruction algorithm. It also describes two new EIT applications.
本文回顾了北美地区电阻抗断层成像技术的最新进展。重点介绍了硬件系统、测量方法和重建算法方面的最新进展。还描述了两种新的电阻抗断层成像应用。