Zhang Yun, Liu Jia-Min, Liu Mei-Hong, Zhang Zi-Bo, Wong Wing-Han, Zhang De-Long
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Key Laboratory of Optoelectronic Information Science & Technology (Ministry of Education), Tianjin University, Tianjin 300072, China.
Department of Engineering, Sorbonne University (Pierre and Marie Curie University), 4 place Jussieu, 75005 Paris, France.
Spectrochim Acta A Mol Biomol Spectrosc. 2020 Oct 5;239:118536. doi: 10.1016/j.saa.2020.118536. Epub 2020 May 27.
Judd-Ofelt (J-O) spectroscopic knowledge of a rare-earth-doped luminescent material is crucial to its application. Although a large number of papers with regard to the J-O study of various rare-earth-doped luminescent materials have been reported each year, few papers presented the errors of the J-O intensity parameters Ω (i = 2, 4, 6) and radiative probabilities evaluated from them. Present study focuses on the error evaluation of the J-O parameters and radiative probabilities. An error theory is established for the J-O analysis and radiative probability. Two error analysis methods based on root mean square of the difference either between measured and calculated oscillator strengths (δf) or between measured and calculated line strengths (δS) are studied. Explicit error expressions are presented for the J-O parameters and radiative probability. The validity of the theory is verified by applying it to widely studied Er, Tm, Ho and Nd ions that are doped into four single-crystals (LiNbO, SrGdGaO, LiYF and YVO) and a glass. The two methods are identical in nature and give similar results of errors of Ω.
稀土掺杂发光材料的贾德 - 奥费尔特（J - O）光谱知识对其应用至关重要。尽管每年都有大量关于各种稀土掺杂发光材料的J - O研究论文报道，但很少有论文提及J - O强度参数Ω（i = 2, 4, 6）以及据此评估的辐射概率的误差。本研究聚焦于J - O参数和辐射概率的误差评估。建立了用于J - O分析和辐射概率的误差理论。研究了基于测量和计算的振子强度之差（δf）或测量和计算的线强度之差（δS）的均方根的两种误差分析方法。给出了J - O参数和辐射概率的明确误差表达式。通过将该理论应用于广泛研究的掺杂到四种单晶（LiNbO、SrGdGaO、LiYF和YVO）和一种玻璃中的铒、铥、钬和钕离子，验证了该理论的有效性。这两种方法本质上是相同的，并且给出了相似的Ω误差结果。
