Molecular Characterization of the Surface Excess Charge Layer in Droplets.

The surface excess charge layer (SECL) in droplets has often been associated with distinct chemistry. We examine the effect of the nature of ions in the composition and structure of SECL by using molecular dynamics. We find that in the presence of simple ions the thickness of SECL is invariant not only with respect to droplet size but also with respect to the nature of the ions. In the presence of simple ions, this layer has a thickness of ∼1.5-1.7 nm but in the presence of macroions it may extend to ∼2.0 nm. The proportion of ions contained in SECL depends on the nature of the ions and the droplet size. For the same droplet size, I and model HO ions show considerably higher concentration than Na and Cl ions. We identify the maximum ion concentration region, which, in nanodrops, may partially overlap with SECL. As the relative shape fluctuations decrease when microdrop size is approached, the overlap between SECL and maximum ion concentration region increases. We suggest the extension of the bilayer droplet structure assumed in the equilibrium partitioning model of Enke to include the maximum ion concentration region that may not coincide with SECL in nanodrops. We compute the ion concentrations in SECL, which are those that should enter the kinetic equation in the ion-evaporation mechanism, instead of the overall drop ion concentration that has been used.