Department of Orthodontics, University of Witten/Herdecke, Witten, Germany.
Department of Oral and Maxillofacial Surgery, University Hospital of Aachen, Aachen, Germany.
Orthod Craniofac Res. 2021 Feb;24(1):78-86. doi: 10.1111/ocr.12406. Epub 2020 Jul 15.
Lateral cephalograms (LC) should be usable to evaluate the vertical bone height of the anterior maxilla for planning the placement of orthodontic mini-implants (OMI). The purpose of this study is to determine the usability of LC for examining the real vertical dimension of the anterior palate.
Lateral cephalograms and corresponding cone beam computed tomography (CBCT) scans were employed for examining 30 fresh cadaver heads.
MATERIALS & METHODS: The minimum (distance A) and maximum (distance B) vertical palatal bone heights on LCs at the level of first premolars were measured, whereas the corresponding measurements were taken via CBCTs on the median, and 2-, 4- and 6-mm paramedian planes. Additionally, the overall minimum vertical palatal height on CBCT was recorded.
Distance A and B on LC were about 8.3 ± 2.5 mm and 9.9 ± 2.5 mm, respectively. The median palatal height on CBCT was significantly higher than both measurements on LC (P < .01). Furthermore, the bone supply on the paramedian planes was similar or higher on CBCT compared to Distance A and similar or less compared to Distance B. The strongest correlation at the level of the premolars was found in the comparison of the maximum vertical palatal height via LC with the vertical palatal height on the median plane via CBCT (r = .84, 95% CI: 0.69-0.92, P < .001).
In order to make the best possible use of the vertical bone supply of the anterior palate and to avoid injuries to the nasal floor, Distance A should be taken into account for planning paramedian OMI placements and distance B for median OMI insertion.
侧位头颅侧位片(LC)可用于评估上颌前部的垂直骨高度,以规划正畸微型种植体(OMI)的植入位置。本研究旨在确定 LC 检查前腭垂直骨高度的可用性。
使用侧位头颅侧位片和相应的锥形束 CT(CBCT)扫描检查 30 个新鲜尸体头颅。
在第一前磨牙水平测量 LC 上最小(距离 A)和最大(距离 B)垂直腭骨高度,而相应的测量值则通过 CBCT 在正中、2、4 和 6mm 旁正中平面上进行。此外,记录 CBCT 上的总最小垂直腭骨高度。
LC 上的距离 A 和 B 分别约为 8.3±2.5mm 和 9.9±2.5mm。CBCT 上的正中腭骨高度明显高于 LC 上的两个测量值(P<.01)。此外,旁正中平面上的骨量供应与 LC 上的距离 A 相似或更高,与距离 B 相似或更低。在切牙水平,LC 上的最大垂直腭骨高度与 CBCT 上的正中平面上的垂直腭骨高度之间的相关性最强(r=.84,95%CI:0.69-0.92,P<.001)。
为了最大限度地利用前腭的垂直骨量并避免损伤鼻底,在规划旁正中 OMI 植入位置时应考虑距离 A,在规划正中 OMI 插入位置时应考虑距离 B。