Apel Daniel, Genzel Martin, Meixner Matthias, Boin Mirko, Klaus Manuela, Genzel Christoph
Helmholtz-Zentrum-Berlin für Materialien und Energie, Berlin, Germany.
Technische Universität Berlin, Institut für Mathematik, Berlin, Germany.
J Appl Crystallogr. 2020 Jun 12;53(Pt 4):1130-1137. doi: 10.1107/S1600576720005506. eCollection 2020 Aug 1.
is a MATLAB-based graphical user interface for the convenient and versatile analysis of energy-dispersive diffraction data obtained at laboratory and synchrotron sources. The main focus of up to now has been on the analysis of residual stresses, but it can also be used to prepare measurement data for subsequent phase analysis or analysis of preferred orientation. The program provides access to the depth-resolved analysis of residual stresses at different levels of approximation. Furthermore, the graphic representation of the results also serves for the consideration of microstructural and texture-related properties. The included material database allows for the quick analysis of the most common materials and is easily extendable. The plots and results produced with can be exported to graphics and text files. is designed to analyze diffraction data from various energy-dispersive X-ray sources. Hence it is possible to add new sources and implement the device-specific properties into . The program is freely available to academic users.
是一个基于MATLAB的图形用户界面,用于方便、多功能地分析在实验室和同步辐射源获得的能量色散衍射数据。到目前为止,其主要重点一直是残余应力分析,但它也可用于为后续的相分析或择优取向分析准备测量数据。该程序提供了在不同近似水平下对残余应力进行深度分辨分析的功能。此外,结果的图形表示也有助于考虑微观结构和织构相关特性。所包含的材料数据库允许快速分析最常见的材料,并且易于扩展。用该程序生成的图表和结果可以导出到图形和文本文件中。该程序旨在分析来自各种能量色散X射线源的衍射数据。因此,可以添加新的源并将设备特定属性实现到该程序中。该程序可供学术用户免费使用。