Mori Shigeo, Nakajima Hiroshi, Kotani Atsuhiro, Harada Ken
Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.
Center for Emergent Matter Science (CEMS), the Institute of Physical and Chemical Research (RIKEN), Hatoyama, Saitama 350-0395, Japan.
Microscopy (Oxf). 2021 Feb 1;70(1):59-68. doi: 10.1093/jmicro/dfaa048.
We describe small-angle electron diffraction (SmAED) and Lorentz microscopy using a conventional transmission electron microscope. In SmAED, electron diffraction patterns with a wide-angular range on the order of 1 × 10-2 rad to 1 × 10-7 rad can be obtained. It is demonstrated that magnetic information of nanoscale magnetic microstructures can be obtained by Fresnel imaging, Foucault imaging and SmAED. In particular, we report magnetic microstructures associated with magnetic stripes and magnetic skyrmions revealed by Lorentz microscopy with SmAED. SmAED can be applied to the analysis of microstructures in functional materials such as dielectric, ferromagnetic and multiferroic materials.
我们描述了使用传统透射电子显微镜进行小角电子衍射(SmAED)和洛伦兹显微镜观察。在SmAED中,可以获得角范围宽达1×10⁻²弧度至1×10⁻⁷弧度的电子衍射图案。结果表明,通过菲涅耳成像、福柯成像和SmAED可以获得纳米级磁性微结构的磁信息。特别是,我们报告了通过带有SmAED的洛伦兹显微镜观察揭示的与磁条和磁斯格明子相关的磁性微结构。SmAED可应用于介电、铁磁和多铁性材料等功能材料的微观结构分析。