Kim Kwang Lok, Hahn Seungyong, Kim Youngjae, Yang Dong Gyu, Song Jung-Bin, Bascuñán Juan, Lee Haigun, Iwasa Yukikazu
Francis Bitter Magnet Laboratory (FBML), Massachusetts Institute of Technology (MIT), Cambridge, MA 02139 USA. Department of Material Science and Engineering, Korea University, Seoul 136-713, Korea.
FBML at MIT, Cambridge, MA 02139 USA.
IEEE Trans Appl Supercond. 2014 Jun;24(3). doi: 10.1109/tasc.2013.2283855. Epub 2013 Sep 27.
This paper presents a study on the effects of winding tension on the characteristic resistance of a no-insulation (NI) coil. Two ReBCO NI test pancake coils, having the same winding i.d. (60 mm), o.d. (67.6 mm), and number of turns (60), were sequentially prepared in a way that the first test coil was wound with a winding tension of 12-N, tested, and then rewound with a new winding tension of 20-N for the same tests. In each test, the test coil was energized at a target current, the power supply was "suddenly" disconnected, and then the temporal decay of the coil center field was measured, from which the time constant of the test coil and the consequent characteristic resistance were obtained. To check the reproducibility of experimental data, each test was repeated four times and each time the test coil was unwound and rewound with a given winding tension. The experimental results were analyzed with equivalent circuit analyses. Correlation between the winding tension and the characteristic resistance was discussed in detail.
本文介绍了一项关于绕组张力对无绝缘（NI）线圈特征电阻影响的研究。制作了两个ReBCO NI测试饼式线圈，它们具有相同的绕组内径（60毫米）、外径（67.6毫米）和匝数（60），制作方式如下：第一个测试线圈以12牛的绕组张力绕制，进行测试，然后以20牛的新绕组张力重新绕制以进行相同测试。在每次测试中，测试线圈在目标电流下通电，电源“突然”断开，然后测量线圈中心场的时间衰减，由此获得测试线圈的时间常数以及相应的特征电阻。为了检验实验数据的可重复性，每次测试重复四次，每次测试线圈都以给定的绕组张力解绕并重新绕制。通过等效电路分析对实验结果进行了分析。详细讨论了绕组张力与特征电阻之间的相关性。
