A modified Marchenko method to retrieve the wave field inside layered metamaterial from reflection measurements at the surface.

With the Marchenko method, it is possible to retrieve the wave field inside a medium from its reflection response at the surface. To date, this method has predominantly been applied to naturally occurring materials. This study extends the Marchenko method for applications in layered metamaterials with, in the low-frequency limit, effective negative constitutive parameters. It illustrates the method with a numerical example, which confirms that the method properly accounts for multiple scattering. The proposed method has potential applications, for example, in non-destructive testing of layered materials.