Pelchat-Voyer Shanny, Piché Michel
J Opt Soc Am A Opt Image Sci Vis. 2020 Sep 1;37(9):1496-1504. doi: 10.1364/JOSAA.400805.
The Gouy phase, which describes how a field accumulates an additional phase shift around the focus compared to a spherical wave, is investigated for the strongly focused beam in free space. It is shown, using both analytical and numerical solutions, that when the effects of the edges of focusing optics are small, the complete variation of the on-axis Gouy phase of the longitudinal electric field is 2. It is true even in the strongly focused limit. Moreover, we show, using an appropriate effective wavevector, how to retrieve the Gouy phase when the diffraction caused by the edges is dominant at the focus. We further investigate the off-axis Gouy phase of the beam and show that any slight variation from the optical axis causes a variation of the Gouy phase of the longitudinal electric field to reduce to .
研究了在自由空间中强聚焦光束的古依相位,它描述了与球面波相比,场在焦点周围如何积累额外的相移。通过解析解和数值解表明,当聚焦光学器件边缘的影响较小时,纵向电场轴上古依相位的完整变化为2。即使在强聚焦极限情况下也是如此。此外,我们展示了如何使用适当的有效波矢,在焦点处边缘引起的衍射占主导时检索古依相位。我们进一步研究了光束的离轴古依相位,并表明与光轴的任何微小偏差都会导致纵向电场古依相位的变化减小到。