Opt Lett. 2020 Sep 15;45(18):5036-5039. doi: 10.1364/OL.402673.
The strong need in materials and biological science has prompted the development of high-speed quantitative phase imaging. However, for phase retrieval applying digital micromirror devices (DMDs), the accuracy of the retrieved phase will be disturbed by the DMD-induced aberrations. Here, we propose a phase retrieval method based on measuring and correcting errors caused by phase non-uniformity of the device. Using only four binary amplitude masks and corresponding diffraction intensities, the proposed method achieves rapid convergence and high-quality reconstruction. The experiments prove the practical feasibility for general samples and the effective improvement of the retrieved phase accuracy.
在材料科学和生物科学的强烈需求推动下，高速定量相位成像技术得以发展。然而，对于应用数字微镜器件（DMD）的相位恢复，DMD 引起的像差会干扰恢复相位的准确性。在这里，我们提出了一种基于测量和校正器件相位不均匀性引起的误差的相位恢复方法。该方法仅使用四个二进制振幅掩模和相应的衍射强度，实现了快速收敛和高质量的重建。实验证明了该方法对于一般样本的实际可行性和对恢复相位精度的有效提高。
