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通过新型高价钼掺杂改善溶液法制备的锌锡氧化物有源层薄膜晶体管性能

Improvement of solution-processed Zn-Sn-O active-layer thin film transistors by novel high valence Mo doping.

作者信息

Peng Cong, Dong Panpan, Li Xifeng

机构信息

Key Laboratory of Advanced Display and System Application of Ministry of Education, Shanghai University, Shanghai, People's Republic of China.

出版信息

Nanotechnology. 2021 Jan 8;32(2):025207. doi: 10.1088/1361-6528/abbc25.

Abstract

In this letter, the performance of Zn-Sn-O (ZTO) thin film transistors (TFTs) has been greatly improved by Mo doping as an oxygen vacancy to control the residual electrons. The results show that the TFT with 3 at% Mo doping exhibits the best electrical characteristics with a high saturation mobility of 26.53 cm V s, a threshold voltage of 0.18 V, a subthreshold swing of 0.32 V dec and a large switching ratio of 2 × 10. The saturation mobility and switching ratio of Mo-doped Zn-Sn-O (MZTO, 3 at%) TFTs improved almost five and two orders of magnitude compared with ZTO TFTs, respectively. Therefore, the MZTO TFT has much potential for future electrical applications with its excellent properties.

摘要

在这封信中,通过掺杂钼作为氧空位来控制残余电子,Zn-Sn-O(ZTO)薄膜晶体管(TFT)的性能得到了极大改善。结果表明,掺杂3at%钼的TFT表现出最佳的电学特性,具有26.53 cm² V⁻¹ s⁻¹的高饱和迁移率、0.18 V的阈值电压、0.32 V dec⁻¹的亚阈值摆幅和2×10⁷的大开关比。与ZTO TFT相比,掺杂钼的Zn-Sn-O(MZTO,3at%)TFT的饱和迁移率和开关比分别提高了近五个和两个数量级。因此,MZTO TFT凭借其优异的性能在未来的电气应用中具有很大的潜力。

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