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通过密度泛函理论计算研究石墨烯与卤素掺杂的MoS和MoSe单层之间的诱导自旋极化相互作用。

Induced spin polarization in graphene interactions with halogen doped MoS and MoSe monolayers by DFT calculations.

作者信息

Sukhanova Ekaterina V, Kvashnin Dmitry G, Popov Zakhar I

机构信息

Moscow Institute of Physics and Technology (State University), 9 Institutskiy per., Dolgoprudny, Moscow Region, 141701, Russian Federation.

出版信息

Nanoscale. 2020 Nov 26;12(45):23248-23258. doi: 10.1039/d0nr06287a.

Abstract

Magnetic halogen doped MoX2 (X = S and Se) monolayers influenced the electronic structure of graphene through a proximity effect. This process was observed using state-of-the-art calculations. It was found that the substitution of a single chalcogen atom with a halogen atom (F, Cl, Br, and I) results in n-type doping of MoX2. An additional electron from the dopant is localized on binding orbitals with the nearest Mo atoms and leads to the formation of magnetism in the dichalcogenide layer. Detailed analysis of halogen doped MoX2/graphene heterostructures demonstrated the induction of spin polarization in graphene near the Fermi energy. Significant spin polarization near the Fermi energy and n-type doping were observed in the graphene layer of MoSe2/graphene heterostructures with MoSe2 doped with iodine. At the same time, fluorine-doped MoSe2 does not cause n-doping in graphene, while spin polarization still takes place. The possibility for the detection of the arrangement of the halogen impurities at the MoX2 basal plane even with the graphene layer deposited on top was demonstrated through STM measurements which will be undoubtedly useful for the fabrication of electronic schemes and elements based on the proposed heterostructures for their further application in nanoelectronics and spintronics.

摘要

磁性卤素掺杂的MoX₂(X = S和Se)单层通过近邻效应影响石墨烯的电子结构。这一过程通过最先进的计算得以观察。研究发现,用卤素原子(F、Cl、Br和I)取代单个硫族原子会导致MoX₂的n型掺杂。掺杂剂的一个额外电子定域在与最近的Mo原子的成键轨道上,并导致二硫族化物层中形成磁性。对卤素掺杂的MoX₂/石墨烯异质结构的详细分析表明,在费米能级附近的石墨烯中诱导了自旋极化。在碘掺杂的MoSe₂的MoSe₂/石墨烯异质结构的石墨烯层中,在费米能级附近观察到显著的自旋极化和n型掺杂。同时,氟掺杂的MoSe₂不会在石墨烯中引起n型掺杂,而自旋极化仍然会发生。通过STM测量证明了即使在顶部沉积有石墨烯层的情况下,也有可能检测MoX₂基面处卤素杂质的排列,这无疑将有助于基于所提出的异质结构制造电子电路和元件,以便它们在纳米电子学和自旋电子学中进一步应用。

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