Wang Yufeng, Swain Greg M, Blanchard G J
Department of Chemistry, Michigan State University, 578 S. Shaw Lane, East Lansing, Michigan 48824-1322, United States.
J Phys Chem B. 2021 Jan 28;125(3):950-955. doi: 10.1021/acs.jpcb.0c10045. Epub 2021 Jan 19.
We have reported previously on the existence of a surface charge-induced free charge density gradient (ρ) in room-temperature ionic liquids (RTILs) with a characteristic persistence length of ca. 50 μm [Ma, K. 2016, 32, 9507-9512]. The free charge density gradient is related to the dielectric response of the RTIL. We report here on the existence of a surface charge-induced gradient in the RTIL refractive index and quantify the relationship between the index gradient and ρ. Because ρ is uniaxial, the induced refractive index gradient is manifested as an induced birefringence. The RTIL sample holder has a curved surface such that the RTIL can function as a lens, and ρ is controlled by the surface charge density (σ) of the (concave) RTIL support. Current passed through an indium-doped tin oxide (ITO) surface layer on the support surface controls σ. The far-field image of light passed through the RTIL lens as a function of σ is used to measure the charge-induced changes of in the RTIL. We demonstrate a modulation of the refractive index on the order of 15%, proportional to σ. This report places the relationship between ρ and RTIL dielectric response on a quantitative footing and suggests the utility of RTILs for electro-optic applications.
我们之前曾报道过,在室温离子液体(RTILs)中存在表面电荷诱导的自由电荷密度梯度(ρ),其特征持续长度约为50μm [Ma, K. 2016, 32, 9507 - 9512]。自由电荷密度梯度与RTIL的介电响应有关。我们在此报告RTIL折射率中表面电荷诱导梯度的存在,并量化折射率梯度与ρ之间的关系。由于ρ是单轴的,诱导的折射率梯度表现为诱导双折射。RTIL样品架具有曲面,使得RTIL可以起到透镜的作用,并且ρ由(凹面)RTIL支撑体的表面电荷密度(σ)控制。通过支撑体表面上的掺铟锡氧化物(ITO)表面层的电流控制σ。通过RTIL透镜的光的远场图像作为σ的函数用于测量RTIL中电荷诱导的变化。我们展示了与σ成比例的约15%量级的折射率调制。本报告将ρ与RTIL介电响应之间的关系置于定量基础上,并表明RTILs在电光应用中的实用性。