• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

使用以扫描透射电子显微镜为中心的原子放置的综合原子探针断层扫描技术,迈向原子尺度断层扫描的一步。

Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography.

作者信息

Ceguerra Anna V, Breen Andrew J, Cairney Julie M, Ringer Simon P, Gorman Brian P

机构信息

Australian Centre for Microscopy & Microanalysis (ACMM), The University of Sydney, Sydney, NSW2006, Australia.

School of Aerospace, Mechanical and Mechatronic Engineering (AMME), The University of Sydney, Sydney, NSW2006, Australia.

出版信息

Microsc Microanal. 2021 Feb;27(1):140-148. doi: 10.1017/S1431927620024873.

DOI:10.1017/S1431927620024873
PMID:33468273
Abstract

Current reconstruction methodologies for atom probe tomography (APT) contain serious geometric artifacts that are difficult to address due to their reliance on empirical factors to generate a reconstructed volume. To overcome this limitation, a reconstruction technique is demonstrated where the analyzed volume is instead defined by the specimen geometry and crystal structure as determined by transmission electron microscopy (TEM) and diffraction acquired before and after APT analysis. APT data are reconstructed using a bottom-up approach, where the post-APT TEM image is used to define the substrate upon which APT detection events are placed. Transmission electron diffraction enables the quantification of the relationship between atomic positions and the evaporated specimen volume. Using an example dataset of ZnMgO:Ga grown epitaxially on c-plane sapphire, a volume is reconstructed that has the correct geometry and atomic spacings in 3D. APT data are thus reconstructed in 3D without using empirical parameters for the reverse projection reconstruction algorithm.

摘要

当前用于原子探针断层扫描(APT)的重建方法存在严重的几何伪像,由于依赖经验因素来生成重建体积,这些伪像难以解决。为克服这一限制,展示了一种重建技术,其中分析体积由样品几何形状和晶体结构定义,该几何形状和晶体结构由透射电子显微镜(TEM)以及在APT分析前后获取的衍射确定。APT数据使用自下而上的方法进行重建,其中APT后的TEM图像用于定义放置APT检测事件的基底。透射电子衍射能够量化原子位置与蒸发样品体积之间的关系。使用在c面蓝宝石上外延生长的ZnMgO:Ga的示例数据集,重建了一个在三维空间中具有正确几何形状和原子间距的体积。因此,在不使用反向投影重建算法的经验参数的情况下,以三维方式重建了APT数据。

相似文献

1
Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography.使用以扫描透射电子显微镜为中心的原子放置的综合原子探针断层扫描技术,迈向原子尺度断层扫描的一步。
Microsc Microanal. 2021 Feb;27(1):140-148. doi: 10.1017/S1431927620024873.
2
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses.针对在薄透射电子显微镜(TEM)样品中制备的原子探针断层扫描样品的系统方法:相关结构、化学和三维重建分析。
Ultramicroscopy. 2018 Jan;184(Pt A):284-292. doi: 10.1016/j.ultramic.2017.10.007. Epub 2017 Oct 12.
3
HAADF-STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy.原子探针断层扫描样本中的高角度环形暗场扫描透射电子显微镜原子计数:迈向定量相关显微镜技术
Ultramicroscopy. 2015 Dec;159 Pt 2:403-12. doi: 10.1016/j.ultramic.2015.02.011. Epub 2015 Feb 23.
4
Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography.通过相关透射电子显微镜和原子探针断层扫描技术在纳米尺度上结合结构和化学信息。
Ultramicroscopy. 2015 Jun;153:32-9. doi: 10.1016/j.ultramic.2015.02.003. Epub 2015 Feb 14.
5
Electron diffraction and imaging for atom probe tomography.用于原子探针断层扫描的电子衍射与成像
Rev Sci Instrum. 2018 May;89(5):053706. doi: 10.1063/1.4999484.
6
Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries.将原子探针断层扫描与原子分辨扫描透射电子显微镜相关联:以硅晶界处的偏析为例
Microsc Microanal. 2017 Apr;23(2):291-299. doi: 10.1017/S1431927617000034. Epub 2017 Feb 20.
7
Removal of hydrocarbon contamination and oxide films from atom probe specimens.去除原子探针试样中的碳氢化合物污染和氧化膜。
Microsc Res Tech. 2021 Feb;84(2):291-297. doi: 10.1002/jemt.23587. Epub 2020 Sep 9.
8
A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.一种通过聚焦离子束和透射电子背散射衍射进行特定位置原子探针样品制备的新方法。
Ultramicroscopy. 2014 Sep;144:9-18. doi: 10.1016/j.ultramic.2014.04.003. Epub 2014 Apr 21.
9
Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features.用于关联中尺度特征的透射电子显微镜和原子探针断层扫描的样品制备
Ultramicroscopy. 2014 Dec;147:25-32. doi: 10.1016/j.ultramic.2014.05.005. Epub 2014 Jun 12.
10
Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale.热生长氧化铝鳞片中晶界的相关原子探针断层成像和透射电子显微镜分析。
Microsc Microanal. 2019 Feb;25(1):11-20. doi: 10.1017/S143192761801557X. Epub 2019 Feb 4.

引用本文的文献

1
Bringing atom probe tomography to transmission electron microscopes.将原子探针断层扫描技术应用于透射电子显微镜。
Nat Commun. 2024 Nov 14;15(1):9870. doi: 10.1038/s41467-024-54169-2.
2
Atom probe tomography.原子探针断层扫描术
Nat Rev Methods Primers. 2021;1(51). doi: 10.1038/s43586-021-00047-w.