Ma Long, Xia Guo, Jin Shiqun, Bai Lihao, Wang Jiangtao, Chen Qiaoqin, Cai Xiaobo
School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, China.
Academy of Opto-Electric Technology, Hefei University of Technology, Hefei 230009, China.
Sensors (Basel). 2021 Jan 18;21(2):641. doi: 10.3390/s21020641.
Refractive index resolution is an important indicator for a wavelength interrogation surface plasmon resonance sensor, which can be affected by signal-to-noise ratio. This paper investigates the impact of spectral signal-to-noise ratio on a surface plasmon resonance sensor. The effects of different spectral powers and noises are compared and verified through simulation and experiments. The results indicate that the optimal resonance wavelength is changed and the refractive index resolution can even be nearly twice as good when the spectral signal-to-noise ratio is increased. The optimal resonance wavelength can be found by changing the spectral power distribution or noise.
折射率分辨率是波长询问表面等离子体共振传感器的一个重要指标，它会受到信噪比的影响。本文研究了光谱信噪比对表面等离子体共振传感器的影响。通过仿真和实验比较并验证了不同光谱功率和噪声的影响。结果表明，当光谱信噪比提高时，最佳共振波长会发生变化，折射率分辨率甚至可以提高近一倍。可以通过改变光谱功率分布或噪声来找到最佳共振波长。
