Stoica Mihai, Sarac Baran, Spieckermann Florian, Wright Jonathan, Gammer Christoph, Han Junhee, Gostin Petre F, Eckert Jürgen, Löffler Jörg F
Laboratory of Metal Physics and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland.
Erich Schmid Institute of Materials Science, Austrian Academy of Sciences (ÖAW), 8700 Leoben, Austria.
ACS Nano. 2021 Feb 23;15(2):2386-2398. doi: 10.1021/acsnano.0c04851. Epub 2021 Jan 29.
The structure of matter at the nanoscale, in particular that of amorphous metallic alloys, is of vital importance for functionalization. With the availability of synchrotron radiation, it is now possible to visualize the internal features of metallic samples without physically destroying them. Methods based on computed tomography have recently been employed to explore the local features. Tomographic reconstruction, while it is relatively uncomplicated for crystalline materials, may generate undesired artifacts when applied to featureless amorphous or nanostructured metallic alloys. In this study we show that X-ray diffraction computed nanotomography can provide accurate details of the internal structure of a metallic glass. We demonstrate the power of the method by applying it to a hierarchically phase-separated amorphous sample with a small volume fraction of crystalline inclusions, focusing the X-ray beam to 500 nm and ensuring a sub-micrometer 2D resolution the number of scans.
纳米尺度下物质的结构，尤其是非晶态金属合金的结构，对于功能化至关重要。随着同步辐射的出现，现在有可能在不物理破坏金属样品的情况下可视化其内部特征。基于计算机断层扫描的方法最近已被用于探索局部特征。断层重建虽然对于晶体材料相对简单，但应用于无特征的非晶态或纳米结构金属合金时可能会产生不需要的伪影。在本研究中，我们表明X射线衍射计算机纳米断层扫描可以提供金属玻璃内部结构的准确细节。我们通过将该方法应用于具有少量晶体夹杂物体积分数的分层相分离非晶样品来证明该方法的威力，将X射线束聚焦到500纳米并确保亚微米级二维分辨率（扫描次数）。
