Wollenweber L, Preston T R, Descamps A, Cerantola V, Comley A, Eggert J H, Fletcher L B, Geloni G, Gericke D O, Glenzer S H, Göde S, Hastings J, Humphries O S, Jenei A, Karnbach O, Konopkova Z, Loetzsch R, Marx-Glowna B, McBride E E, McGonegle D, Monaco G, Ofori-Okai B K, Palmer C A J, Plückthun C, Redmer R, Strohm C, Thorpe I, Tschentscher T, Uschmann I, Wark J S, White T G, Appel K, Gregori G, Zastrau U
European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA.
Rev Sci Instrum. 2021 Jan 1;92(1):013101. doi: 10.1063/5.0022886.
We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter.
我们介绍了一种在欧洲X射线自由电子激光（XFEL）的高能量密度科学仪器上测量高分辨率非弹性X射线散射的装置。该装置在切槽单色仪中使用Si(533)反射，并在近背散射几何结构中使用三个球形切割分析晶体，以实现高光谱分辨率。实验装置展示了44毫电子伏特的能量分辨率，接近理论上可实现的最小分辨率。分析晶体和探测器安装在弯曲轨道系统上，无需破坏真空就能快速可靠地改变散射角。整个装置设计用于以10赫兹运行，这与该仪器上可用的高功率激光器的重复频率以及欧洲XFEL的基本重复频率相同。在其他测量中，可以预想该装置将有助于研究高瞬态激光产生的物质状态的动力学。
