Mitome Masanori
Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki Tsukuba Ibaraki, 305-0044, Japan.
Microscopy (Oxf). 2021 Feb 1;70(1):69-74. doi: 10.1093/jmicro/dfaa053.
A phase retrieval technique based on a transport of intensity equation (TIE) is one of the defocus series reconstruction techniques in microscopy. Since it does not require any dedicated devices like a biprism, and only three defocus images are enough to retrieve phase information, it has been applied to observe magnetic fields, magnetic domains, electrostatic potentials and strains. It is also used to improve image resolution by correcting spherical aberration. This technique is simple and easy to use, but some artifacts often appear in the retrieved phase map. One should pay careful attention to the experimental conditions and the algorithms and boundary conditions used to solve the TIE. This paper reviews the principle of the TIE method, the algorithms used to solve it and application results in materials science.
基于强度传输方程（TIE）的相位恢复技术是显微镜散焦系列重建技术之一。由于它不需要像双棱镜这样的任何专用设备，并且仅三张散焦图像就足以恢复相位信息，因此已被应用于观察磁场、磁畴、静电势和应变。它还用于通过校正球差来提高图像分辨率。该技术简单易用，但在恢复的相位图中经常会出现一些伪像。人们应该仔细注意实验条件以及用于求解TIE的算法和边界条件。本文综述了TIE方法的原理、用于求解它的算法以及在材料科学中的应用结果。
