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用于实现薄膜晶体管超低亚阈值摆幅的低温超临界脱羟基作用

Low-temperature supercritical dehydroxylation for achieving an ultra-low subthreshold swing of thin-film transistors.

作者信息

Chang Kuan-Chang, Hu Luodan, Qi Kang, Li Lei, Lin Xinnan, Zhang Shengdong, Wang Ziwen, Lai Ying-Chih, Liu Heng-Jui, Kuo Tze-Peng

机构信息

School of Electronic and Computer Engineering, Peking University, Shenzhen Graduate School, Shenzhen 518055, China.

出版信息

Nanoscale. 2021 Mar 21;13(11):5700-5705. doi: 10.1039/d0nr08208b. Epub 2021 Feb 10.

DOI:10.1039/d0nr08208b
PMID:33565548
Abstract

Thin-film transistors (TFTs) have been widely used in the increasingly advanced field of displays. However, it remains a challenge for TFTs to overcome the poor subthreshold swing in the fast switching and high-speed applications. Here, we provide a solution to the above-mentioned challenge via supercritical dehydroxylation, which combines a low temperature, environmentally friendly supercritical fluid technology with a CaCl treatment. An embedded structure of amorphous indium gallium zinc oxide (a-IGZO) TFTs with double-layer high-k dielectric containing TaO and SiO layers was first manufactured. The subthreshold swing of the fabricated TFTs treated with supercritical dehydroxylation was optimized to an ultra-low value of 72.7 mV dec. Moreover, other key figures of merits including threshold voltage, on/off ratio and field effect mobility all improved after the supercritical dehydroxylation. The bandgap of the gate dielectric material increased due to the supercritical dehydroxylation verified by the current conduction mechanism. Besides, numerous material analyses further confirmed that owing to the supercritical dehydroxylation the dominant dehydration reactions can effectively repair the defects introduced in the device manufacture. The ultra-low subthreshold swing with optimized electrical performances can be achieved via the low-temperature supercritical dehydroxylation treatment, enabling its promising potential in realizing ultra-fast and low power electronics.

摘要

薄膜晶体管(TFT)已在日益先进的显示领域中得到广泛应用。然而,对于TFT而言,在快速切换和高速应用中克服较差的亚阈值摆幅仍是一项挑战。在此,我们通过超临界脱羟基提供了一种解决上述挑战的方案,该方案将低温、环境友好的超临界流体技术与氯化钙处理相结合。首先制造了具有包含TaO和SiO层的双层高k电介质的非晶铟镓锌氧化物(a-IGZO)TFT的嵌入式结构。经超临界脱羟基处理的制造的TFT的亚阈值摆幅被优化到72.7 mV/dec的超低值。此外,在超临界脱羟基处理后,包括阈值电压、开/关比和场效应迁移率在内的其他关键性能指标均有所改善。通过电流传导机制验证,由于超临界脱羟基作用,栅极介电材料的带隙增大。此外,大量材料分析进一步证实,由于超临界脱羟基作用,主要的脱水反应可以有效修复器件制造过程中引入的缺陷。通过低温超临界脱羟基处理可以实现具有优化电性能的超低亚阈值摆幅,这使其在实现超高速和低功耗电子器件方面具有广阔的潜力。

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