Kim J K, Casa Diego, Huang Xianrong, Gog Thomas, Kim B J, Kim Jungho
Center for Artificial Low Dimensional Electronic Systems, Institute for Basic Science (IBS), Pohang 790-784, Republic of Korea.
Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
J Synchrotron Radiat. 2020 Jul 1;27(Pt 4):963-969. doi: 10.1107/S1600577520005792. Epub 2020 May 27.
Resonant inelastic X-ray scattering (RIXS) is increasingly playing a significant role in studying highly correlated systems, especially since it was proven capable of measuring low-energy magnetic excitations. However, despite high expectations for experimental evidence of novel magnetic phases at high pressure, unequivocal low-energy spectral signatures remain obscured by extrinsic scattering from material surrounding the sample in a diamond anvil cell (DAC): pressure media, Be gasket and the diamond anvils themselves. A scattered X-ray collimation based medium-energy resolution (∼100 meV) analyzer system for a RIXS spectrometer at the Ir L-absorption edge has been designed and built to remediate these difficulties. Due to the confocal nature of the analyzer system, the majority of extrinsic scattering is rejected, yielding a clean low-energy excitation spectrum of an iridate SrIrO sample in a DAC cell. Furthermore, the energy resolution of different configurations of the collimating and analyzing optics are discussed.
共振非弹性X射线散射(RIXS)在研究强关联体系中发挥着越来越重要的作用,特别是自从它被证明能够测量低能磁激发以来。然而,尽管人们对高压下新型磁相的实验证据寄予厚望,但明确的低能光谱特征仍被金刚石对顶砧(DAC)中样品周围材料的非本征散射所掩盖:压力介质、铍垫片和金刚石砧本身。为了克服这些困难,设计并搭建了一种基于散射X射线准直的中能分辨率(约100 meV)分析器系统,用于Ir L吸收边的RIXS光谱仪。由于分析器系统的共焦特性,大部分非本征散射被排除,从而在DAC样品池中得到了铱酸盐SrIrO样品清晰的低能激发光谱。此外,还讨论了准直和分析光学系统不同配置下的能量分辨率。