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锗硒中的亚价键合导致高热电性能。

Metavalent Bonding in GeSe Leads to High Thermoelectric Performance.

作者信息

Sarkar Debattam, Roychowdhury Subhajit, Arora Raagya, Ghosh Tanmoy, Vasdev Aastha, Joseph Boby, Sheet Goutam, Waghmare Umesh V, Biswas Kanishka

机构信息

New Chemistry Unit, Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Jakkur P.O., Bangalore, 560064, India.

Theoretical Sciences Unit, Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Jakkur P.O., Bangalore, 560064, India.

出版信息

Angew Chem Int Ed Engl. 2021 Apr 26;60(18):10350-10358. doi: 10.1002/anie.202101283. Epub 2021 Mar 22.

Abstract

Orthorhombic GeSe is a promising thermoelectric material. However, large band gap and strong covalent bonding result in a low thermoelectric figure of merit, zT≈0.2. Here, we demonstrate a maximum zT≈1.35 at 627 K in p-type polycrystalline rhombohedral (GeSe) (AgBiTe )  , which is the highest value reported among GeSe based materials. The rhombohedral phase is stable in ambient conditions for x=0.8-0.29 in (GeSe) (AgBiTe )  . The structural transformation accompanies change from covalent bonding in orthorhombic GeSe to metavalent bonding in rhombohedral (GeSe) (AgBiTe )  . (GeSe) (AgBiTe ) has closely lying primary and secondary valence bands (within 0.25-0.30 eV), which results in high power factor 12.8 μW cm  K at 627 K. It also exhibits intrinsically low lattice thermal conductivity (0.38 Wm  K at 578 K). Theoretical phonon dispersion calculations reveal vicinity of a ferroelectric instability, with large anomalous Born effective charges and high optical dielectric constant, which, in concurrence with high effective coordination number, low band gap and moderate electrical conductivity, corroborate metavalent bonding in (GeSe) (AgBiTe ) . We confirmed the presence of low energy phonon modes and local ferroelectric domains using heat capacity measurement (3-30 K) and switching spectroscopy in piezoresponse force microscopy, respectively.

摘要

正交晶系的GeSe是一种很有前景的热电材料。然而,大的带隙和强共价键导致其热电品质因数较低,zT≈0.2。在此,我们展示了在627 K时,p型多晶菱面体(GeSe)(AgBiTe) 的zT最大值约为1.35,这是基于GeSe的材料中报道的最高值。对于(GeSe)(AgBiTe) 中x = 0.8 - 0.29的情况,菱面体相在环境条件下是稳定的。结构转变伴随着从正交晶系GeSe中的共价键到菱面体(GeSe)(AgBiTe) 中的准金属键的变化。(GeSe)(AgBiTe) 具有紧密相邻的主价带和次价带(在0.25 - 0.30 eV范围内),这导致在627 K时具有12.8 μW cm  K的高功率因子。它还表现出固有的低晶格热导率(在578 K时为0.38 Wm  K)。理论声子色散计算揭示了铁电不稳定性的临近,具有大的反常玻恩有效电荷和高光学介电常数,这与高有效配位数、低带隙和适度的电导率一起,证实了(GeSe)(AgBiTe) 中的准金属键。我们分别使用热容测量(3 - 30 K)和压电响应力显微镜中的开关光谱法证实了低能声子模式和局部铁电畴的存在。

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