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拓扑绝缘体表面的多杂质散射

Many-impurity scattering on the surface of a topological insulator.

作者信息

Hernando José Luis, Baba Yuriko, Díaz Elena, Domínguez-Adame Francisco

机构信息

GISC, Departamento de Física de Materiales, Universidad Complutense, 28040, Madrid, Spain.

出版信息

Sci Rep. 2021 Mar 11;11(1):5810. doi: 10.1038/s41598-021-84801-w.

Abstract

We theoretically address the impact of a random distribution of non-magnetic impurities on the electron states formed at the surface of a topological insulator. The interaction of electrons with the impurities is accounted for by a separable pseudo-potential method that allows us to obtain closed expressions for the density of states. Spectral properties of surface states are assessed by means of the Green's function averaged over disorder realisations. For comparison purposes, the configurationally averaged Green's function is calculated by means of two different self-consistent methods, namely the self-consistent Born approximation (SCBA) and the coherent potential approximation (CPA). The latter is often regarded as the best single-site theory for the study of the spectral properties of disordered systems. However, although a large number of works employ the SCBA for the analysis of many-impurity scattering on the surface of a topological insulator, CPA studies of the same problem are scarce in the literature. In this work, we find that the SCBA overestimates the impact of the random distribution of impurities on the spectral properties of surface states compared to the CPA predictions. The difference is more pronounced when increasing the magnitude of the disorder.

摘要

我们从理论上探讨了非磁性杂质的随机分布对拓扑绝缘体表面形成的电子态的影响。电子与杂质的相互作用通过一种可分离的赝势方法来考虑,该方法使我们能够获得态密度的封闭表达式。表面态的光谱特性通过对无序实现进行平均的格林函数来评估。为了进行比较,通过两种不同的自洽方法,即自洽玻恩近似(SCBA)和相干势近似(CPA)来计算构型平均格林函数。后者通常被认为是研究无序系统光谱特性的最佳单格点理论。然而,尽管大量工作采用SCBA来分析拓扑绝缘体表面的多杂质散射,但文献中对同一问题的CPA研究却很少。在这项工作中,我们发现与CPA预测相比,SCBA高估了杂质随机分布对表面态光谱特性的影响。当增加无序强度时,这种差异更为明显。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c987/7971016/05341af1b9c0/41598_2021_84801_Fig1_HTML.jpg

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