W-检验用于遗传上位性检验。
W-Test for Genetic Epistasis Testing.
机构信息
The Chinese University of Hong Kong, Hong Kong, China.
出版信息
Methods Mol Biol. 2021;2212:45-53. doi: 10.1007/978-1-0716-0947-7_4.
The genetic epistasis effect has been widely acknowledged as an essential contributor to genetic variation in complex diseases. In this chapter, we introduce a powerful and efficient statistical method, called W-test, for genetic epistasis testing. A wtest R package is developed for the implementation of the W-test method, which provides various functions to measure the main effect, pairwise interaction, higher-order interaction, and cis-regulation of SNP-CpG pairs in genetic and epigenetic data. It allows flexible stagewise and exhaustive association testing as well as diagnostic checking on the probability distributions in a user-friendly interface. The wtest package is available in CRAN at https://CRAN.R-project.org/package=wtest .
遗传上位效应已被广泛认为是复杂疾病中遗传变异的一个重要贡献因素。在本章中，我们介绍了一种强大而有效的统计方法，称为 W 检验，用于遗传上位效应检验。开发了一个 wtest R 包来实现 W 检验方法，该方法提供了各种功能来测量遗传和表观遗传数据中 SNP-CpG 对的主效应、成对相互作用、高阶相互作用和顺式调控。它允许在用户友好的界面中灵活地分阶段和穷举关联测试以及对概率分布进行诊断检查。wtest 包可在 https://CRAN.R-project.org/package=wtest 上的 CRAN 中获得。
Zotero 插件