Xiang X, Duxbury P M, Zerbe B
Department of Physics and Astronomy, Michigan State University, 567 Wilson Rd., East Lansing, MI 48224.
Phys Rev E. 2021 Feb;103(2-1):023202. doi: 10.1103/PhysRevE.103.023202.
High-resolution single-shot nonrelativistic ultrafast electron microscopy (UEM) relies on adaptive optics to compress high-intensity bunches using radio frequency (RF) cavities. We present a comprehensive discussion of the analytic approaches available to characterize bunch dynamics as an electron bunch goes through a longitudinal focal point after an RF cavity where space charge effects can be large. Methods drawn from the Coulomb explosion literature, the accelerator physics literature, and the analytic Gaussian model developed for UEM are compared, utilized, and extended in some cases. In particular the longitudinal focus may occur in two different regimes, a bounce-back regime and a crossover regime; and we characterize the critical point separating these regimes in the zero-emittance model. Results from N-particle simulations using efficient multipole methods are compared to the theoretical models revealing features requiring extensions of the analytic approaches; and in particular mechanisms for emittance growth and transfer are discussed.
