Chen Cheng, Leach Richard, Wang Jian, Liu Xiaojun, Jiang Xiangqian, Lu Wenlong
Opt Lett. 2021 Apr 1;46(7):1616-1619. doi: 10.1364/OL.405443.
We introduce an iteration-free approach, based on a centroid algorithm with a locally adaptive threshold, for nanometer-level peak position localization of the axial response signal in confocal microscopy. This approach has localization accuracies that are near theoretical limits, especially when there is a small number of sampling points within the discrete signal. The algorithm is also orders of magnitude faster compared to fitting schemes based on maximum likelihood estimation. Simulations and experiments demonstrate the localization performance of the approach.
我们介绍一种基于具有局部自适应阈值的质心算法的免迭代方法，用于共聚焦显微镜中轴向响应信号的纳米级峰值位置定位。这种方法具有接近理论极限的定位精度，特别是当离散信号中的采样点数量较少时。与基于最大似然估计的拟合方案相比，该算法的速度也快几个数量级。仿真和实验证明了该方法的定位性能。
