Rodríguez Varela Fernando, López Morales Manuel José, Tena Sánchez Rubén, Muriel Barrado Alfonso Tomás, de la Fuente González Elena, Posada Quijano Guillermo, Zarzuelo Torres Carlos, Sierra Pérez Manuel, Sierra Castañer Manuel
Radiation Group, Universidad Politécnica de Madrid, 28040 Madrid, Spain.
Indra Sistemas S.A., 28830 Torrejón de Ardoz, Spain.
Sensors (Basel). 2021 Mar 3;21(5):1744. doi: 10.3390/s21051744.
This paper introduces a near-field measurement system concept for the fast testing of linear arrays suited for mass production scenarios where a high number of nominally identical antennas needs to be measured. The proposed system can compute the radiation pattern, directivity and gain on the array plane, as well as the array complex feeding coefficients in a matter of seconds. The concept is based on a multi-probe antenna array arranged in a line which measures the near field of the antenna under test in its array plane. This linear measurement is postprocessed with state-of-the-art single-cut transformation techniques. To compensate the lack of full 3D information, a previous complete characterization of a "Gold Antenna" is performed. This antenna is nominally identical to the many ones that will be measured with the proposed system. Therefore, the data extracted from this full characterization can be used to complement the postprocessing steps of the single-cut measurements. An X-band 16-probe demonstrator of the proposed system is implemented and introduced in this paper, explaining all the details of its architecture and operation steps. Finally, some measurement results are given to compare the developed demonstrator with traditional anechoic measurements, and show the potential capabilities of the proposed concept to perform fast and reliable measurements.
本文介绍了一种近场测量系统概念,用于快速测试适用于大规模生产场景的线性阵列,在这种场景中需要测量大量名义上相同的天线。所提出的系统能够在几秒钟内计算出阵列平面上的辐射方向图、方向性和增益,以及阵列的复馈电系数。该概念基于排列成一条线的多探头天线阵列,用于在其阵列平面内测量被测天线的近场。这种线性测量采用先进的单切面变换技术进行后处理。为了弥补缺乏完整三维信息的不足,首先对一个“黄金天线”进行完整表征。该天线名义上与将用所提出的系统测量的许多天线相同。因此,从这种完整表征中提取的数据可用于补充单切面测量的后处理步骤。本文实现并介绍了所提出系统的一个X波段16探头演示器,阐述了其架构和操作步骤的所有细节。最后,给出了一些测量结果,将所开发的演示器与传统的消声测量进行比较,并展示了所提出概念进行快速可靠测量的潜在能力。