Radnik Jörg, Kersting Reinhard, Hagenhoff Birgit, Bennet Francesca, Ciornii Dmitri, Nymark Penny, Grafström Roland, Hodoroaba Vasile-Dan
Bundesanstalt für Materialforschung und-Prüfung (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Unter den Eichen 87, 12205 Berlin, Germany.
Tascon GmbH, Mendelstr. 17, 48149 Münster, Germany.
Nanomaterials (Basel). 2021 Mar 5;11(3):639. doi: 10.3390/nano11030639.
The minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community.
描述了保证纳米材料高质量表面分析数据所需的最低信息要求，目的是为风险评估方法提供有关尺寸、形状、元素组成和表面化学的可靠且可追溯的信息。考虑了广泛使用的表面分析方法，如电子显微镜（SEM）、能量色散X射线光谱（EDS）、X射线光电子能谱（XPS）和二次离子质谱（SIMS）。概述了从样品制备、测量到数据分析以及报告和存档的数据格式的完整分析序列。所有选定的方法多年来一直用于表面分析，因此分析的许多方面（包括（元）数据格式）已经标准化。作为一个实际分析用例，选择了联合研究中心（JRC）储存库中提供的两个包覆TiO的参考纳米颗粒样品。基于所选分析方法明确的最低信息要求，突出了互补分析的附加值。本文主要旨在作为理解纳米材料表面分析中高质量数据已达到的高标准水平的来源，为纳米安全领域提供可靠的输入。
