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基于数据驱动和由粗到精的分析仪器信号基线校正方法。

Data-driven and coarse-to-fine baseline correction for signals of analytical instruments.

机构信息

Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, 518055, China.

Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, 518055, China.

出版信息

Anal Chim Acta. 2021 May 1;1157:338386. doi: 10.1016/j.aca.2021.338386. Epub 2021 Mar 13.

DOI:10.1016/j.aca.2021.338386
PMID:33832586
Abstract

Baseline correction is an indispensable step in the signal processing of chemical analysis instruments. With the increasing demand for on-site applications, a variety of analytical instruments require a more friendly, rapid and adaptive baseline correction method. In this paper, a data-driven and coarse-to-fine (DD-CF) baseline correction scheme mainly based on the empirical mode decomposition (EMD) algorithm is proposed. For eliminating the mode-mixing effect of the original EMD, the proposed method firstly obtains a coarse baseline estimation using automatic peak detection, elimination and interpolation; and the EMD is applied on the coarse baseline to get a fine baseline finally. We have compared this method with the adaptive iteratively reweighted Penalized Least Squares algorithm (airPLS) and the sparse representation baseline correction methods using simulated signals and experimental signals from different analytical instruments. Results indicate that the proposed DD-CF scheme can effectively estimate the baseline more accurate than the comparing methods for varies of analytical signals such as mass spectrometer, ion mobility spectrometer, gas chromatograph, etc. Furthermore, with signals of different length, different peak distributions and even from totally different instruments, the proposed method requires minimal user intervention, in which the parameters of the comparing methods should be adjusted for a wide range.

摘要

基线校正(Baseline correction)是化学分析仪器信号处理中不可或缺的一步。随着现场应用需求的增加,各种分析仪器需要更友好、快速和自适应的基线校正方法。本文提出了一种主要基于经验模态分解(EMD)算法的数据驱动和粗到精(DD-CF)基线校正方案。为了消除原始 EMD 的模态混叠效应,该方法首先使用自动峰检测、消除和插值获得粗略的基线估计值;然后在粗略的基线基础上应用 EMD 最终得到精细的基线。我们使用模拟信号和来自不同分析仪器的实验信号比较了该方法与自适应迭代重加权惩罚最小二乘算法(airPLS)和稀疏表示基线校正方法。结果表明,与比较方法相比,该方法可以更有效地估计基线,适用于各种分析信号,如质谱仪、离子迁移谱仪、气相色谱仪等。此外,对于不同长度、不同峰分布甚至来自完全不同仪器的信号,该方法所需的用户干预最小,而比较方法的参数需要进行广泛调整。

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