Barak Neelam, Kumari Vineeta, Sheoran Gyanendra
Department of ECE, NIT Delhi, NILERD Campus, Narela, Delhi, 110040, India.
Department of Applied Sciences, NIT Delhi, NILERD Campus, Narela, Delhi, 110040, India.
Micron. 2021 Jun;145:103064. doi: 10.1016/j.micron.2021.103064. Epub 2021 Mar 31.
In this work, we propose simulation and analysis of a novel combination of a variable numerical aperture wide-field microscope objective with an Electrically Tunable Lens (ETL) for axial scanning with a telecentric image space. This work resolves the challenges of the conventional ETL based wide-field microscopic systems viz. variable magnification, field-of-view (FOV), an inconsistent lateral and axial resolution. The proposed combination performs the tuning of the object plane by changing ETL current and effectively modifies the object space numerical aperture using an aperture controller to provide a stationary telecentric image plane. Moreover, with the proposed combination, the lateral resolution of the system is preserved over an axial range of 7.586mm with a magnification error of 2.55 %. The proposed work witnesses the advantages of providing fast axial scanning, extended axial scanning range, autofocusing, invariant magnification, constant FOV, and constant resolution along with a compact optical setup.
在这项工作中，我们提出了一种新型组合的模拟与分析，该组合将可变数值孔径宽视场显微镜物镜与电可调透镜（ETL）相结合，用于具有远心像空间的轴向扫描。这项工作解决了传统基于ETL的宽视场显微系统的挑战，即可变放大率、视场（FOV）、横向和轴向分辨率不一致的问题。所提出的组合通过改变ETL电流来调整物平面，并使用孔径控制器有效地修改物空间数值孔径，以提供固定的远心像平面。此外，通过所提出的组合，系统的横向分辨率在7.586mm的轴向范围内得以保持，放大误差为2.55%。所提出的工作展现出具有快速轴向扫描、扩展轴向扫描范围、自动聚焦、不变放大率、恒定视场和恒定分辨率以及紧凑光学设置等优点。
