Duan Shuai, Cui Yangfan, Yi Wencai, Chen Xin, Yang Bingchao, Liu Xiaobing
Laboratory of High Pressure Physics and Material Science (HPPMS), School of Physics and Physical Engineering, Qufu Normal University, Qufu, Shandong 273165, China.
ACS Appl Mater Interfaces. 2021 Apr 28;13(16):18800-18808. doi: 10.1021/acsami.1c01860. Epub 2021 Apr 13.
GeP materials are attracting broad research interest due to their typical puckered layer structure, high carrier mobility, and chemical stability. This peculiarity expedites the independent control of anisotropic electrical and thermal conductance, which is thus expected to possess great thermoelectric potential. Nevertheless, the metal characteristics of GeP in the bulk and thick films are adverse to real application because of the low Seebeck coefficient. Thus, it is highly desirable to explore effective solutions to broaden the band gap and also maintain its excellent electrical conductance. Herein, we designed the interlaced GeP/hexagonal boron nitride (h-BN) bulk heterostructure using various component thicknesses. By using calculations based on the Boltzmann transport theory, we found that capping h-BN layer can obviously increase the band gap of the GeP layer by 0.24 eV, and more interestingly, the anisotropic electronic structure in the GeP/h-BN heterostructure was accordingly modulated toward a favorable direction for high thermoelectricity. An ultrahigh value of around 5 was predicted at 300 K in p-type GeP/h-BN, attributed to the adjusted multivalley band structure. Overall, our work provided an effective route to design novel high-performance thermoelectrics through the appropriate construction of heterostructures.