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用于电光、光电和光学器件的综合矢量分析。

Comprehensive vector analysis for electro-optical, opto-electronic, and optical devices.

作者信息

Qing Ting, Li Shupeng, Tang Xiaohu, Li Ping, Chen Xufeng, Wang Lihan, Fang Yijie, Cao Meihui, Wu Lugang, Pan Shilong

出版信息

Opt Lett. 2021 Apr 15;46(8):1856-1859. doi: 10.1364/OL.422817.

DOI:10.1364/OL.422817
PMID:33857086
Abstract

High-performance electro-optical (E-O), opto-electronic (O-E), and optical (O-O) devices are widely used in optical communications, microwave photonics, fiber sensors, and so on. Measurement of the amplitude and phase responses are essential for the development and fabrication of these devices. However, the previous methods can hardly characterize the E-O, O-E, and O-O devices with arbitrary responses. Here we propose a comprehensive vector analyzer based on optical asymmetrical double-sideband (ADSB) modulation to overcome this difficulty. The ADSB solves the problem of frequency aliasing and can extract information from both the +1st- and -1st-order sidebands. Thus, most devices in photonic applications, including phase modulators, can be characterized. In the experiment, a commercial photodetector, a phase modulator, and a sampled FBG are used as the O-E, E-O, and O-O devices under test, respectively. A frequency resolution of 2 MHz, an electrical sweeping range of 40 GHz, and an optical sweeping range of 80 GHz are achieved.

摘要

高性能电光(E-O)、光电(O-E)和光学(O-O)器件广泛应用于光通信、微波光子学、光纤传感器等领域。幅度和相位响应的测量对于这些器件的开发和制造至关重要。然而,以前的方法很难对具有任意响应的E-O、O-E和O-O器件进行表征。在此,我们提出一种基于光学不对称双边带(ADSB)调制的综合矢量分析仪来克服这一困难。ADSB解决了频率混叠问题,并且可以从 +1阶和 -1阶边带中提取信息。因此,包括相位调制器在内的光子应用中的大多数器件都可以得到表征。在实验中,分别使用一个商用光电探测器、一个相位调制器和一个采样光纤布拉格光栅(FBG)作为被测的O-E、E-O和O-O器件。实现了2 MHz的频率分辨率、40 GHz的电扫描范围和80 GHz的光扫描范围。

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