Li Xingjia, Shi Zhi, Zhang Xiuli, Meng Xiangjian, Huang Zhiqiang, Zhang Dandan
School of Mathematics, Physics and Statistics, Shanghai University of Engineering Science, Shanghai 201620, China.
Research Center for Advanced Mirco-and Nano-Fabrication Materials, Shanghai University of Engineering Science, Shanghai 201620, China.
Membranes (Basel). 2021 Apr 21;11(5):301. doi: 10.3390/membranes11050301.
The effect of testing temperature and storage period on the polarization fatigue properties of poly (vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) ultrathin film devices were investigated. The experimental results show that, even after stored in air for 150 days, the relative remanent polarization (Pr/Pr(0)) of P(VDF-TrFE) of ultrathin films can keep at a relatively high level of 0.80 at 25 °C and 0.70 at 60 °C. To account for this result, a hydrogen fluoride (HF) formation inhibition mechanism was proposed, which correlated the testing temperature and the storage period with the microstructure of P(VDF-TrFE) molecular chain. Moreover, a theoretical model was constructed to describe the polarization fatigue evolution of P(VDF-TrFE) samples.
研究了测试温度和储存时间对聚(偏二氟乙烯-三氟乙烯)(P(VDF-TrFE))超薄膜器件极化疲劳性能的影响。实验结果表明,即使在空气中储存150天后,P(VDF-TrFE)超薄膜在25℃时的相对剩余极化强度(Pr/Pr(0))仍可保持在较高水平0.80,在60℃时为0.70。为了解释这一结果,提出了一种氟化氢(HF)形成抑制机制,该机制将测试温度和储存时间与P(VDF-TrFE)分子链的微观结构联系起来。此外,构建了一个理论模型来描述P(VDF-TrFE)样品的极化疲劳演变。