Piniard Matthieu, Sorrente Béatrice, Hug Gilles, Picart Pascal
Opt Express. 2021 May 10;29(10):14720-14735. doi: 10.1364/OE.423391.
This paper presents analytical modelling for describing the speckle noise decorrelation in phase data from two- or multiple-wavelength digital holography. A novel expression for the modulus of the coherence factor is proposed for the case of two-wavelength speckle decorrelation from imaging roughness and surface shape through an optical system. The expression permits us to estimate the speckle decorrelation phase noise in surface shape measurements. The theoretical analysis is supported by realistic simulations including both the surface roughness and shape. The results demonstrate the very good agreement between the modulus of the coherence factor estimated with the simulation and the one calculated with theory.
本文提出了一种分析模型，用于描述来自双波长或多波长数字全息术的相位数据中的散斑噪声去相关。针对通过光学系统对成像粗糙度和表面形状进行双波长散斑去相关的情况，提出了一种相干因子模的新表达式。该表达式使我们能够估计表面形状测量中的散斑去相关相位噪声。理论分析得到了包括表面粗糙度和形状的实际模拟的支持。结果表明，模拟估计的相干因子模与理论计算的相干因子模之间具有很好的一致性。
