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使用半导体探测器测定诊断千伏 X 射线束水模体的表面剂量。

Determination of the surface dose of a water phantom using a semiconductor detector for diagnostic kilovoltage x-ray beams.

机构信息

Graduate School of Health Sciences, Kumamoto University, 4-24-1 Kuhonji, Chuo-ku, Kumamoto 862-0976, Japan.

Department of Health Sciences, Faculty of Life Sciences, Kumamoto University, 4-24-1 Kuhonji, Chuo-ku, Kumamoto 862-0976, Japan.

出版信息

Phys Med. 2021 Apr;84:198-204. doi: 10.1016/j.ejmp.2021.04.009. Epub 2021 May 12.

DOI:10.1016/j.ejmp.2021.04.009
PMID:33991839
Abstract

PURPOSE

To determine the surface dose of a water phantom using a semiconductor detector for diagnostic kilovoltage x-ray beams.

METHODS

An AGMS-DM+ semiconductor detector was calibrated in terms of air kerma measured with an ionization chamber. Air kerma was measured for 20 x-ray beams with tube voltages of 50-140 kVp and a half-value layer (HVL) of 2.2-9.7 mm Al for given quality index (QI) values of 0.4, 0.5, and 0.6, and converted to the surface dose. Finally, the air kerma and HVL measured by the AGMS-DM+ detector were expressed as a ratio of the surface dose for 10 × 10 and 20 × 20 cm fields. The ratio of both was represented as a function of HVL for the given QI values and verified by comparing it with that calculated using the Monte Carlo method.

RESULTS

The air kerma calibration factor, CF, for the AGMS-DM+ detector ranged from 0.986 to 1.016 (0.9% in k = 1). The CF values were almost independent of the x-ray fluence spectra for the given QI values. The ratio of the surface dose to the air kerma determined by the PTW 30,013 chamber and the AGMS-DM+ detector was less than 1.8% for the values calculated using the Monte Carlo method, and showed a good correlation with the HVL for the given QI values.

CONCLUSION

It is possible to determine the surface dose of a water phantom from the air kerma and HVL measured by a semiconductor detector for given QI values.

摘要

目的

使用半导体探测器确定水模体的表面剂量,用于诊断千伏 X 射线束。

方法

使用电离室测量空气比释动能,对 AGMS-DM+半导体探测器进行校准。针对给定的质量指数(QI)值 0.4、0.5 和 0.6,测量了管电压为 50-140 kVp、半值层(HVL)为 2.2-9.7 mm Al 的 20 个 X 射线束的空气比释动能,并将其转换为表面剂量。最后,AGMS-DM+探测器测量的空气比释动能和 HVL 表示为 10×10 和 20×20 cm 射野的表面剂量的比值。对于给定的 QI 值,用 HVL 表示这两个比值,并通过与蒙特卡罗方法计算的值进行比较来验证。

结果

AGMS-DM+探测器的空气比释动能校准因子 CF 范围为 0.986-1.016(k=1 时为 0.9%)。对于给定的 QI 值,CF 值几乎与 X 射线通量谱无关。PTW 30,013 腔室和 AGMS-DM+探测器测量的空气比释动能与表面剂量的比值,使用蒙特卡罗方法计算的值小于 1.8%,并且与给定 QI 值的 HVL 具有良好的相关性。

结论

对于给定的 QI 值,可以从半导体探测器测量的空气比释动能和 HVL 确定水模体的表面剂量。

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