Meunier A, Katz J L, Christel P, Sedel L
Laboratoire de Recherches Orthopédiques, Faculté de Médecine, Lariboisière-Saint-Louis, Paris, France.
J Orthop Res. 1988;6(5):770-5. doi: 10.1002/jor.1100060521.
A relatively simple scanning acoustic microscope (SAM) that operates in the reflection mode has been constructed. The system uses a 20 MHz spherically focused transducer, acting both as transmitter and as detector, to obtain acoustic impedance information on a thin surface layer at a maximum resolution of approximately 100 micron. The specimen is mounted on an X-Y driving system (precision, 5 micron) under computer control in order to scan a grid of 256 x 256 points across areas ranging from 6.5 to 1300 mm2. An algorithm is used to reference the data against standards; specially developed software provides for pseudo-color mapping, three-dimensional images, zooming to 16 x magnification, contouring, and single line profiles of the data. The system has been used to determine inhomogeneities in surface acoustic properties of mineralized tissues and implant materials, in many cases as a complement to using ultrasonic wave propagation techniques to measure the bulk anisotropic properties.
已构建了一种相对简单的反射模式扫描声学显微镜（SAM）。该系统使用一个20兆赫兹的球形聚焦换能器，它同时充当发射器和探测器，以获取薄表面层的声阻抗信息，最大分辨率约为100微米。样品安装在计算机控制下的X - Y驱动系统（精度为5微米）上，以便在6.5至1300平方毫米的区域内扫描256×256点的网格。使用一种算法将数据与标准进行比对；专门开发的软件可提供伪彩色映射、三维图像、放大至16倍、绘制轮廓以及数据的单线剖面图。该系统已用于确定矿化组织和植入材料表面声学特性的不均匀性，在许多情况下可作为使用超声波传播技术测量整体各向异性特性的补充。
